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Delta Microscopies

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× EM-Tec JV70J versatile dovetail SEM stage adapter with 14mm JEOL stub connection for JEOL FESEMs 7800F, 7601F, 7600F, 7500F, 7400F, 7200F, 7100F, 7000F, 6700F, 6500F, JIB4600, iT300HR plus SEMs iT300 and iT500 EM-Tec JV70J versatile dovetail SEM stage adapter with 14mm JEOL stub connection for JEOL FESEMs 7800F, 7601F, 7600F, 7500F, 7400F, 7200F, 7100F, 7000F, 6700F, 6500F, JIB4600, iT300HR plus SEMs iT300 and iT500 (Ref: D11-000572)
× EM-Tec HJ12 Hitachi M4 adapter for Ø15mm JEOL or ISI stubs, Ø25x10mm, M4 EM-Tec HJ12 Hitachi M4 adapter for Ø15mm JEOL or ISI stubs, Ø25x10mm, M4 (Ref: D11-000316)
× EM-Tec JV60 versatile dovetail SEM stage adapter with M4 screw for JEOL SEMs 6610, 6490, 6480, 6460, 5910, 5900, 5800 and JIB 4500 FIB/SEM EM-Tec JV60 versatile dovetail SEM stage adapter with M4 screw for JEOL SEMs 6610, 6490, 6480, 6460, 5910, 5900, 5800 and JIB 4500 FIB/SEM (Ref: D11-000564)
× AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs (Ref: D14-AE1201)

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