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Remove item	Product	Quantity
×	AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs (Ref: D14-AE1201)	AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs (Ref: D14-AE1201) quantity
×	EM-Tec HJ11 Hitachi M4 adapter for Ø12.2mm JEOL stubs, Ø15x10mm, M4 (Ref: D11-000311)	EM-Tec HJ11 Hitachi M4 adapter for Ø12.2mm JEOL stubs, Ø15x10mm, M4 (Ref: D11-000311) quantity
×	EM-Tec H15P M4 adapter for pin stub, Ø15x16mm, M4 (Ref: D11-000304)	EM-Tec H15P M4 adapter for pin stub, Ø15x16mm, M4 (Ref: D11-000304) quantity
×	EM-Tec HS18 mini swivel split mount vise for up to 8mm, aluminium, M4 (Ref: D12-003330)	EM-Tec HS18 mini swivel split mount vise for up to 8mm, aluminium, M4 (Ref: D12-003330) quantity
×	EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, M4 (Ref: D12-000317)	EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, M4 (Ref: D12-000317) quantity
×	EM-Tec JV70J versatile dovetail SEM stage adapter with 14mm JEOL stub connection for JEOL FESEMs 7800F, 7601F, 7600F, 7500F, 7400F, 7200F, 7100F, 7000F, 6700F, 6500F, JIB4600, iT300HR plus SEMs iT300 and iT500 (Ref: D11-000572)	EM-Tec JV70J versatile dovetail SEM stage adapter with 14mm JEOL stub connection for JEOL FESEMs 7800F, 7601F, 7600F, 7500F, 7400F, 7200F, 7100F, 7000F, 6700F, 6500F, JIB4600, iT300HR plus SEMs iT300 and iT500 (Ref: D11-000572) quantity

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