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×	AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs (Ref: D14-AE1201)	AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs (Ref: D14-AE1201) quantity
×	EM-Tec HS4 M4 adapter for Cambridge S4 stubs, M4 (Ref: D11-000305)	EM-Tec HS4 M4 adapter for Cambridge S4 stubs, M4 (Ref: D11-000305) quantity
×	EM-Tec double sided conductive copper SEM tape 12mm x 33m (Ref: D15-000212)	EM-Tec double sided conductive copper SEM tape 12mm x 33m (Ref: D15-000212) quantity
×	EM-Tec 127G.AM SEM pin stub gripper tweezers for Ø12.7mm pin stubs, anti-magnetic stainless steel (Ref: D50-050012)	EM-Tec 127G.AM SEM pin stub gripper tweezers for Ø12.7mm pin stubs, anti-magnetic stainless steel (Ref: D50-050012) quantity
×	EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, M4 (Ref: D12-000317)	EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, M4 (Ref: D12-000317) quantity
×	EM-Tec 320.AM SEM stub gripper tweezers for Ø32mm cylinder stubs, anti-magnetic stainless steel (Ref: D50-050320)	EM-Tec 320.AM SEM stub gripper tweezers for Ø32mm cylinder stubs, anti-magnetic stainless steel (Ref: D50-050320) quantity

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