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Delta Microscopies

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× EM-Tec JV50J versatile dovetail SEM stage adapter with JEOL 14mm stub connection for JEOL SEMs iT100, 6510, 6390, 6380, 6360, 6010, 5700, 5600, 5500, 5410, 5400, 5300, 5200, T330, T300, T220, T200, T100 and T20 EM-Tec JV50J versatile dovetail SEM stage adapter with JEOL 14mm stub connection for JEOL SEMs iT100, 6510, 6390, 6380, 6360, 6010, 5700, 5600, 5500, 5410, 5400, 5300, 5200, T330, T300, T220, T200, T100 and T20 (Ref: D11-000552)
× EM-Tec H6 multi stub holder for 6 x Ø15mm Hitachi stubs, Ø50x6mm, M4 EM-Tec H6 multi stub holder for 6 x Ø15mm Hitachi stubs, Ø50x6mm, M4 (Ref: D12-000358)
× AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs (Ref: D14-AE1201)
× EM-Tec JV70J versatile dovetail SEM stage adapter with 14mm JEOL stub connection for JEOL FESEMs 7800F, 7601F, 7600F, 7500F, 7400F, 7200F, 7100F, 7000F, 6700F, 6500F, JIB4600, iT300HR plus SEMs iT300 and iT500 EM-Tec JV70J versatile dovetail SEM stage adapter with 14mm JEOL stub connection for JEOL FESEMs 7800F, 7601F, 7600F, 7500F, 7400F, 7200F, 7100F, 7000F, 6700F, 6500F, JIB4600, iT300HR plus SEMs iT300 and iT500 (Ref: D11-000572)
× EM-Tec B26 bulk sample holder for up 26mm, aluminium, M4 EM-Tec B26 bulk sample holder for up 26mm, aluminium, M4 (Ref: D12-000325)
× EM-Tec HS18 mini swivel split mount vise for up to 8mm, aluminium, M4 EM-Tec HS18 mini swivel split mount vise for up to 8mm, aluminium, M4 (Ref: D12-003330)

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