.png){kind=small}
.png){kind=small}
Showing 301–450 of 692 results
Filters
Sort results
Reset
Apply
 |
Brass/Nickel plated. Coverslips can be stacked with spacers (up to 15 coverslips with a thickness… Show more (+) Brass/Nickel plated. Coverslips can be stacked with spacers (up to 15 coverslips with a thickness up to 2mm) with samples placed on top of each coverslip. Fluids freely exchange between coverslips. Both spacers and weights come with the unit. The upper part of the holder is grooved to accept tweezers.Available in two configurationsCoverslip Holder 1: for 9 to 13 mm diameter coverslips; accommodates 10 coverslips. Dimensions: 16mm (D) x 24mm (H)Coverslip Holder 2: for 16 to 22 mm diameter coverslips; accommodates 10 coverslips. Dimensions: 24mm (D) x 25mm (H) Show less (-) |
 |
|
 |
Our unique small particle sample holder comes with a quick release particle screen, which is… Show more (+) Our unique small particle sample holder comes with a quick release particle screen, which is available in 3 different sizes, (30µm, 10µm and 2µm), accomodating a multitude of sample sizes.The overall dimension of the holder is 30.5 mm H x 30.5 mm D (1.20" x 1.20") and is made from 316 stainless steel.The interior dimension is 20 mm H x 20 mm D (0.80" x 0.80") Show less (-) |
 |
We offer a comprehensive choice of standard pin stubs to support virtually all applications. The… Show more (+) We offer a comprehensive choice of standard pin stubs to support virtually all applications. The standard SEM pin stubs are compatible with Thermo Fisher, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. They are made from vacuum grade aluminium. They are machined according to the original manufacturer’s […] Show less (-) |
 |
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use… Show more (+) The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8'') diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling Show less (-) |
 |
We offer a comprehensive choice of standard pin stubs to support virtually all applications. The… Show more (+) We offer a comprehensive choice of standard pin stubs to support virtually all applications. The standard SEM pin stubs are compatible with Thermo Fisher, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. They are made from vacuum grade aluminium. They are machined according to the original manufacturer's specifications and dimensions. The flat pin stubs from 12.7mm to 38mm diameter are grooved for easy and clean handling. The most used pin stubs are the Ø12.7 mm and the Ø25.4 mm pin stubs. Pins are all 3.2mm diameter with a length of either 8mm or 9.5mm. The Ø12.7 mm pin stubs are also available in brass, copper and high purity carbon. Show less (-) |
 |
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use… Show more (+) The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8”) diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin […] Show less (-) |
 |
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use… Show more (+) The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8'') diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling Show less (-) |
 |
The EBSD-3D sample holder for FEI / Thermo DualBeam FESEM/FIB systems permits FIB milling of… Show more (+) The EBSD-3D sample holder for FEI / Thermo DualBeam FESEM/FIB systems permits FIB milling of the sample and subsequent acquisition of EBSD data. Repeatedly rotating the sample 180 between the milling and the EBSD mapping positions enables collecting 3D EBSD mapping data. This holder is to be used with the FEI EBS3 software and FEI […] Show less (-) |
 |
Show more (+)
each Show less (-) |
