.png?strip=all&lossy=1&ssl=1){kind=small}
.png?strip=all&lossy=1&ssl=1){kind=small}
Showing 1–150 of 292 results
Filters
Sort results
Reset
Apply
 |
For aperture cleaning, vacuum evaporation. |
 |
For aperture cleaning, vacuum evaporation |
 |
Particle-size standards are certified for mean diameter and are traceable to the National Bureau of… Show more (+) Particle-size standards are certified for mean diameter and are traceable to the National Bureau of Standards (NBS). Duke Scientific's new line of standards in the submicrometer size range is called Nanosphere Size Standards™, and Monosized Polymer Microspheres.Capacity 15ml Show less (-) |
 |
The set is comprised of 28 minerals
|
|
The set is comprised of 28 minerals
|
 |
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-) |
|
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-) |
|
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-) |
|
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-) |
 |
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-) |
