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Delta Microscopies

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Ultra High Resolution Au-C Test on JEOL Stub
With gold particles ranging from <2nm to 30nm, this test is suitable for ultra…
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With gold particles ranging from <2nm to 30nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test. Technical Data Sheet : Gold Particles On Carbon Ultra High Resolution Calibration Specimenseach
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Very High Resolution Au-C Test on 12.5mm Pin Stub
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Very High Resolution Au-C Test on Carbon Planchet
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Very High Resolution Au-C Test on Hitachi Stub
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Very High Resolution Au-C Test on ISI Stub
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Very High Resolution Au-C Test on JEOL Stub
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