All products SEM - SPM Calibration - Delta Microscopies

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	AFM SPM NioProbe Calibration NIOPROBE The Nioprobe device is used to determine the shape at the very apex of… Show more (+) NIOPROBE The Nioprobe device is used to determine the shape at the very apex of the tip probe for microscopy. The Problem The physical probe used in AFM imaging is not ideally sharp. As a consequence, an AFM image does not reflect the true sample topography impartially, but rather represents the interaction of the tip […] Show less (-)
	AFM/SPM Tipcheck Calibration TIPCHECK The Tipcheck device is used for examining the shaft of the tip probe or… Show more (+) TIPCHECK The Tipcheck device is used for examining the shaft of the tip probe or for determining the tip breakage etc. The Problem When imaging a new sample in an AFM, it may be difficult to know whether one has obtained an accurate representation of the surface. Even in the case that a fairly clear […] Show less (-)
	BSE Reference, Nickel (Z=28)/Copper (Z=29) each
	BSE Reference, Palladium (Z=46)/Silver (z=47) each
	BSE Reference, Platinum (Z=78)/Gold (Z=79) each
	Calibration Standard Model 70-1D with Cert Mounted on 15mm Steel Disk for AFM each
	Calibration Standard Model 70-1D with Cert Mounted on Pin Stub Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-)
	Calibration Standard Model 70-1D with Cert Mounted on Steel Disk for AFM each
	Calibration Standard Model 70-1D with Cert Unmounted Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-)
	Calibration Standard Model 70-1D with Cert – Choose Mount Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-)

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