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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use… Show more (+) The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8'') diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling Show less (-) |
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The EBSD-3D sample holder for FEI / Thermo DualBeam FESEM/FIB systems permits FIB milling of… Show more (+) The EBSD-3D sample holder for FEI / Thermo DualBeam FESEM/FIB systems permits FIB milling of the sample and subsequent acquisition of EBSD data. Repeatedly rotating the sample 180 between the milling and the EBSD mapping positions enables collecting 3D EBSD mapping data. This holder is to be used with the FEI EBS3 software and FEI […] Show less (-) |
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The EM-Tec B16 bulk sample holder is a compact holder for samples up the 16mm… Show more (+) The EM-Tec B16 bulk sample holder is a compact holder for samples up the 16mm. Ideal for cross- sections, small samples.
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