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The FEI Teneo VolumeScope systems uses specially designed sample stubs with a 3.1mm diameter… Show more (+) The FEI Teneo VolumeScope systems uses specially designed sample stubs with a 3.1mm diameter pin. The sample mounted on these pins are used for serial sectioning and serial block-face BSD imaging to create 3D imaging data of the sample structure. The sample area consists of a raised platform with 2mm diameter which sits on a Ø8mm head. To improve handling of the FEI Teneo VS pins, we have added a groove in the side of the Ø8mm head. With the groove, the FEI VS Teneo pins can be easily handled, removed from the sample holder and placed in storage boxes.
These pin stubs are fully compatible with the FEI Teneo VS SEM system; Ø3.1mm pin, Ø8mm head and raised platform for sample mounting. Manufactured from vacuum grade aluminium. Show less (-) |
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The Gatan3View systems use special sample pins. These are used inside SEMs to create 3D… Show more (+) The Gatan3View systems use special sample pins. These are used inside SEMs to create 3D imaging data of samples by serial slicing and BSD imaging. The sample pins are offered with two sample areas: – standard Ø1.4mm flat as sample area – larger Ø2.4mm flat as sample area. These pins are fully compatible with the […] Show less (-) |
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The Gatan3View systems use special sample pins. These are used inside SEMs to create 3D… Show more (+) The Gatan3View systems use special sample pins. These are used inside SEMs to create 3D imaging data of samples by serial slicing and BSD imaging. The sample pins are offered with two sample areas:
– standard Ø1.4mm flat as sample area
– larger Ø2.4mm flat as sample area.
These pins are fully compatible with the Gatan 3View systems; Ø2mm pin, Ø3mm head with cone top and total height of 12.5mm. Manufactured from vacuum grade aluminium.
When you need a special Gatan 3view sample stub, which is not offered on our website, please contact us. We can manufacture custom sample stubs or might be able to suggest a solution with alternative sample stubs. Show less (-) |
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