{"id":290129,"date":"2021-12-09T12:39:22","date_gmt":"2021-12-09T11:39:22","guid":{"rendered":"https:\/\/www.deltamicroscopies.com\/produit\/em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids\/"},"modified":"2025-11-28T20:27:44","modified_gmt":"2025-11-28T19:27:44","slug":"em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids","status":"publish","type":"product","link":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids\/","title":{"rendered":"EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al\/Cu, Co, AISI 316L and 400\/1000 mesh Ni grids"},"content":{"rendered":"<p><img decoding=\"async\" src=\"https:\/\/www.microtonano.com\/images\/productimages-small\/36-000408.JPG\" alt=\"EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al\/Cu, Co, AISI 316L and 400\/1000 mesh Ni grids\" \/><\/p>\n<p>The EM-Tec EDX-Checker has been developed as a cost-efficient tool for quick and easy checking of calibration, performance, and resolution of an EDX system on an SEM.\u00a0 Regular use of the EDX-Checker ensures optimum performance of the EDX detector. The EM-Tec EDX-Checker consists of a standard aluminium SEM pin stub with NI grids and the reference materials C, PTFE, Mn, Co, AISI 316L and Al\/Cu embedded in a vacuum compatible epoxy. The EDX-Checker stub with the reference materials is polished down to 0.5um and coated with carbon. The additional Boron Nitride is not carbon coated.<\/p>\n<p>The EM-Tec EDX-Checker features:<\/p>\n<ul>\n<li>Quick and easy EDX calibration and performance check<\/li>\n<li>Ideal for EDX Systems from EDAX, Thermo, Bruker, Oxford Instruments, IXRF, Phenom and JEOL<\/li>\n<li>Polished surface \u2013 no topography artefacts with the reference materials<\/li>\n<li>Available in two versions<\/li>\n<li>Known and consistent take-off angle due to polished surface<\/li>\n<li>Hexagonal white BN does not need conductive carbon coating<\/li>\n<li>Low magnification image and X-ray mapping calibration<\/li>\n<li>Compact and cost effective<\/li>\n<li>Available as pin stub and with adapters for JEOL and Hitachi SEMs<\/li>\n<\/ul>\n<p>The EM-Tec EDX-Checker is available in two versions:<\/p>\n<ul>\n<li><strong>EDX-Checker S8\u00a0<\/strong>with C, PTFE, Mn, Co and Al\/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check. Ideally suited for table top SEMs with EDS.<\/li>\n<li><strong>EDX-Checker LE-10<\/strong>\u00a0with BN, C, PTFE, Mn, Co and Al\/Cu as reference materials, AISI 316L for quantitative analysis check and a 400mesh Nickel grid for quick magnification calibration and mapping check. Optimised for low element performance check.<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>EDX-Checker S8 with C, PTFE, Mn, Co and Al\/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check.<\/p>\n","protected":false},"featured_media":289742,"comment_status":"open","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","inline_featured_image":false},"product_brand":[1914,1915],"product_cat":[1096],"product_tag":[],"class_list":{"0":"post-290129","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_brand-hitachi","7":"product_brand-jeol","8":"product_cat-standards","10":"first","11":"instock","12":"taxable","13":"shipping-taxable","14":"purchasable","15":"product-type-variable"},"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al\/Cu, Co, AISI 316L and 400\/1000 mesh Ni grids - Delta Microscopies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al\/Cu, Co, AISI 316L and 400\/1000 mesh Ni grids - Delta Microscopies\" \/>\n<meta property=\"og:description\" content=\"EDX-Checker S8 with C, PTFE, Mn, Co and Al\/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids\/\" \/>\n<meta property=\"og:site_name\" content=\"Delta Microscopies\" \/>\n<meta property=\"article:modified_time\" content=\"2025-11-28T19:27:44+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.deltamicroscopies.com\/wp-content\/uploads\/2021\/12\/36-000408.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"500\" \/>\n\t<meta property=\"og:image:height\" content=\"247\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al\/Cu, Co, AISI 316L and 400\/1000 mesh Ni grids - Delta Microscopies","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids\/","og_locale":"en_US","og_type":"article","og_title":"EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al\/Cu, Co, AISI 316L and 400\/1000 mesh Ni grids - Delta Microscopies","og_description":"EDX-Checker S8 with C, PTFE, Mn, Co and Al\/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check.","og_url":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids\/","og_site_name":"Delta Microscopies","article_modified_time":"2025-11-28T19:27:44+00:00","og_image":[{"width":500,"height":247,"url":"https:\/\/www.deltamicroscopies.com\/wp-content\/uploads\/2021\/12\/36-000408.jpg","type":"image\/jpeg"}],"twitter_misc":{"Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids\/","url":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-edx-checker-s-8-with-c-ptfe-mn-al-cu-co-aisi-316l-and-400-1000-mesh-ni-grids\/","name":"EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al\/Cu, Co, AISI 316L and 400\/1000 mesh Ni grids - 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