{"id":302354,"date":"2018-12-20T12:05:34","date_gmt":"2018-12-20T11:05:34","guid":{"rendered":"https:\/\/www.deltamicroscopies.com\/produit\/model-300-2d-choose-the-mount\/"},"modified":"2018-12-20T12:05:34","modified_gmt":"2018-12-20T11:05:34","slug":"model-300-2d-choose-the-mount","status":"publish","type":"product","link":"https:\/\/www.deltamicroscopies.com\/en\/products\/model-300-2d-choose-the-mount\/","title":{"rendered":"Model 300-2D, choose the mount"},"content":{"rendered":"

SPM Calibration Specimens<\/span><\/h1>\n

Overall Benefits:<\/span><\/h2>\n

– Easier testing of your SPM.
\n– Improved accuracy of critical dimension measurements.
\n– Accuracy: 0.5% (1 std. dev.).<\/p>\n

Features and Benefits:<\/span><\/h2>\n

– Holographic fabrication – assures high accuracy and precision.
\n– Pattern height > 100nm – provide excellent image contrast.
\n– Uniform coverage of entire chip – save time (can image anywhere).<\/p>\n

Description:\"SPM<\/span><\/h2>\n

– Nominal calibrated dimensions: 300 or 700 nm.
\n– Calibration certificate: supplied with each sample, stating the dimension to the nearest 1 nm.
\n– Pattern types: 1- or 2\u2014Dimensional. The calibrated dimension is the same for both axes for the 2-D standard.
\n– Feature geometry:
\n– parallel ridges (1-D, 300 or 700nm)
\n– cylindrical posts (2-D 300nm)
\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 – diamond-shaped posts (2-D 700nm)
\n– Physical Size: 3 mm x 4 mm x 0.5mm.
\n– Substrate: Silicon wafer.
\n– Top surface: Tungsten film.<\/p>\n

 <\/p>\n

The 1-D standards can be scanned using any AFM mode, including contact mode. The 2-D standards can be scanned using modes such as Tapping Mode™, intermittent contact, and non-contact.<\/p>\n

Model 150-1D<\/span><\/strong><\/h2>\n

Accurate measurements of sub 0.5 micron features are increasingly important as nanotechnology develops an\"AFMd as conventional microfabricated structures (semiconductors, magnetic data storage devices, optical data discs) shrinking. The model 150-1D with a nominal period (pitch) of 150nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass) is the new tool to support this work.<\/p>\n

Model 750-HD<\/strong>\"scanning<\/span><\/h2>\n

High Durability Calibration Reference Specimen for AFM and STM
\nEach specimen is supplied with a calibration certificate. Can be used for AFM, STM and SEM. Has been used successfully in a hot water AFM.<\/p>\n\n\n\n\n\n\n
Nominal pattern dimensions<\/td>\nPitch 750 nm<\/td>\n<\/tr>\n
<\/td>\nHeight 100 nm<\/td>\n<\/tr>\n
Nominal specimen dimensions<\/td>\n6.35 nm diameter, 0.3 mm thick<\/td>\n<\/tr>\n
Composition<\/td>\nSolid Nickel<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

 <\/p>\n

Model PT<\/span><\/strong><\/h2>\n

Phase Imaging Test Specimen (verify TappingMode™ phase contrast and resolution).
\nPhase Imaging is a sharp probe, which is brought into proximity with the specimen surface. The probe is oscillated vertically near its mechanical resonance fre-quency. As the probe lightly taps the surface, the amplitude of oscillation is reduced and the AFM uses this change in amplitude in order to track the surface topography. In addition \"Atomicto its amplitude, the probe motion can be characterized by its phase relative to a driving oscillator. The phase signal changes when the probe encounters regions of different composition. Phase shifts are registered as bright and dark regions in phase images, comparable to the way height changes are indicated in height images.
\nPhase images often show extraordinary contrast for many composite surfaces of technological and scientific interest. These include contamination deposits, discontinuous (i.e. defective) thin films, devices built of composite materials (e.g. magnetic recording heads), and cross-sectional specimens of composite materials. Both inorganic and organic materials can be examined. We have found that phase imaging is more convenient and gentler than other methods, which are based on contact mode operation. It routinely achieves lateral resolution of 10 nm.<\/p>\n

Models 300-2D, 300-1D, 700-2D and 700-1D<\/span><\/strong><\/h2>\n

All mounted on 15 mm steel disk.<\/p>\n

Models 300-1D and 300-2D<\/span><\/strong><\/h2>\n

\"AFM
\nParallel Ridges
\nPitch 288
\nW-coated Photoresist on Si
\nuse contact or TappingMode<\/p>\n

Models\u00a0 300-2D<\/span><\/strong><\/h2>\n

\"Scanning<\/p>\n

Array of Posts
\nPitch 297
\nAl bumps on Si
\nuse contact or TappingMode<\/p>\n

Models 700-1D\u00a0<\/span><\/strong><\/h2>\n

\"Microscope
\n700-1D
\nParallel Ridges
\nPitch 700
\nW-coated Photoresist on Si
\nuse contact or TappingMode<\/p>\n

Models\u00a0 700-2D<\/span><\/strong><\/h2>\n

\"Microscope<\/p>\n

700-2D
\nArray of Posts
\nPitch 700
\nW-coated Photoresist on Si
\nuse TappingMode<\/p>\n

References<\/strong>
\n1. Pereira, D.E.D. & Claudio-da-Silva, Jr., E. \u201cImprovement of AFM as an analytical Instrument for Residual Lignin Characterization\u201d in: Proceedings International Symposium on Wood and Pulping Chemistry, Helsinki, Finland, June 1995.
\n2. Pereria, D.E.D, Chernoff, D., Claudio-da-Silva, Jr. E., & Cemuner, B.J., \u201cThe use of AFM to investigate the delignification process: Part I \u2013AFM performance by differentiating pulping processes\u201d, to be published.<\/p>\n","protected":false},"excerpt":{"rendered":"

SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]<\/p>\n","protected":false},"featured_media":285733,"comment_status":"open","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"off","_et_pb_old_content":"","_et_gb_content_width":"","inline_featured_image":false},"product_brand":[],"product_cat":[1412,1096],"product_tag":[],"class_list":{"0":"post-302354","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-spm-calibrator-en","7":"product_cat-standards","9":"first","10":"instock","11":"taxable","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"yoast_head":"\nModel 300-2D, choose the mount - Delta Microscopies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.deltamicroscopies.com\/en\/products\/model-300-2d-choose-the-mount\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Model 300-2D, choose the mount - Delta Microscopies\" \/>\n<meta property=\"og:description\" content=\"SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.deltamicroscopies.com\/en\/products\/model-300-2d-choose-the-mount\/\" \/>\n<meta property=\"og:site_name\" content=\"Delta Microscopies\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.deltamicroscopies.com\/wp-content\/uploads\/2018\/12\/D300-2D.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"300\" \/>\n\t<meta property=\"og:image:height\" content=\"300\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"3 minutes\" \/>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Model 300-2D, choose the mount - Delta Microscopies","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.deltamicroscopies.com\/en\/products\/model-300-2d-choose-the-mount\/","og_locale":"en_US","og_type":"article","og_title":"Model 300-2D, choose the mount - Delta Microscopies","og_description":"SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). 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