{"id":302931,"date":"2018-12-12T09:53:21","date_gmt":"2018-12-12T08:53:21","guid":{"rendered":"https:\/\/www.deltamicroscopies.com\/produit\/em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4\/"},"modified":"2022-03-15T16:10:56","modified_gmt":"2022-03-15T15:10:56","slug":"em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4","status":"publish","type":"product","link":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4\/","title":{"rendered":"EM-Tec high purity carbon Hitachi SEM sample stub, \u00d825 x 6mm x M4"},"content":{"rendered":"<p><span style=\"display: inline !important; float: none; background-color: transparent; color: #666666; cursor: text; font-family: 'Open Sans',Arial,sans-serif; font-size: 14px; font-style: normal; font-variant: normal; font-weight: 500; letter-spacing: normal; orphans: 2; text-align: left; text-decoration: none; text-indent: 0px; text-transform: none; -webkit-text-stroke-width: 0px; white-space: normal; word-spacing: 0px;\">The standard SEM stubs used in an SEM are mostly made from aluminum and sometimes brass. This is fine for many applications if the sample is large and can be mounted directly of the stub. However, for small samples, powders, particles in solutions and fibers the material of the stub can interfere with backscattered electron imaging or X-ray micro-analysis. To avoid such interference, it is better to mount the sample on an EM-Tec high purity carbon (graphite) specimen stub. The high purity graphitised carbon, which is used for the EM-tec carbon SEM stubs, contains less than 2ppm impurities with 1ppm or less for each single element. The impurities can be B, Mg, Al, Si, Ca or Fe. The available carbon SEM specimen mounts are:<\/span><br \/>\n<span style=\"display: inline !important; float: none; background-color: transparent; color: #666666; cursor: text; font-family: 'Open Sans',Arial,sans-serif; font-size: 14px; font-style: normal; font-variant: normal; font-weight: 500; letter-spacing: normal; orphans: 2; text-align: left; text-decoration: none; text-indent: 0px; text-transform: none; -webkit-text-stroke-width: 0px; white-space: normal; word-spacing: 0px;\">&#8211; \u00d812.7mm standard pin stub<\/span><br \/>\n<span style=\"display: inline !important; float: none; background-color: transparent; color: #666666; cursor: text; font-family: 'Open Sans',Arial,sans-serif; font-size: 14px; font-style: normal; font-variant: normal; font-weight: 500; letter-spacing: normal; orphans: 2; text-align: left; text-decoration: none; text-indent: 0px; text-transform: none; -webkit-text-stroke-width: 0px; white-space: normal; word-spacing: 0px;\">&#8211; \u00d815mm Hitachi mount with M4 threaded hole<\/span><br \/>\n<span style=\"display: inline !important; float: none; background-color: transparent; color: #666666; cursor: text; font-family: 'Open Sans',Arial,sans-serif; font-size: 14px; font-style: normal; font-variant: normal; font-weight: 500; letter-spacing: normal; orphans: 2; text-align: left; text-decoration: none; text-indent: 0px; text-transform: none; -webkit-text-stroke-width: 0px; white-space: normal; word-spacing: 0px;\">&#8211; \u00d825mm Hitachi mount with M4 threaded hole<\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>The standard SEM stubs used in an SEM are mostly made from aluminum and sometimes brass. This is fine for many applications if the sample is large and can be mounted directly of the stub. However, for small samples, powders, particles in solutions and fibers the material of the stub can interfere with backscattered electron [&hellip;]<\/p>\n","protected":false},"featured_media":285496,"comment_status":"open","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","inline_featured_image":false},"product_brand":[1914],"product_cat":[1376,1440,1296,1297,1365],"product_tag":[],"class_list":{"0":"post-302931","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_brand-hitachi","7":"product_cat-accessoires-par-marque-de-microscope-en","8":"product_cat-hitachi-tm-microscope-de-table-en","9":"product_cat-supports-et-adaptateurs-en","10":"product_cat-tubes-cylindres-plots-supports-et-adaptateurs-en","11":"product_cat-meb-sem-en","13":"first","14":"instock","15":"taxable","16":"shipping-taxable","17":"purchasable","18":"product-type-variable"},"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>EM-Tec high purity carbon Hitachi SEM sample stub, \u00d825 x 6mm x M4 - Delta Microscopies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"EM-Tec high purity carbon Hitachi SEM sample stub, \u00d825 x 6mm x M4 - Delta Microscopies\" \/>\n<meta property=\"og:description\" content=\"The standard SEM stubs used in an SEM are mostly made from aluminum and sometimes brass. This is fine for many applications if the sample is large and can be mounted directly of the stub. However, for small samples, powders, particles in solutions and fibers the material of the stub can interfere with backscattered electron [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4\/\" \/>\n<meta property=\"og:site_name\" content=\"Delta Microscopies\" \/>\n<meta property=\"article:modified_time\" content=\"2022-03-15T15:10:56+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.deltamicroscopies.com\/wp-content\/uploads\/2018\/12\/D10-CC4025-EM-Tec_high_purity_carbon_HITACHI_SEM_pin_stub_diam55mm_M4.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"300\" \/>\n\t<meta property=\"og:image:height\" content=\"300\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"EM-Tec high purity carbon Hitachi SEM sample stub, \u00d825 x 6mm x M4 - Delta Microscopies","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4\/","og_locale":"en_US","og_type":"article","og_title":"EM-Tec high purity carbon Hitachi SEM sample stub, \u00d825 x 6mm x M4 - Delta Microscopies","og_description":"The standard SEM stubs used in an SEM are mostly made from aluminum and sometimes brass. This is fine for many applications if the sample is large and can be mounted directly of the stub. However, for small samples, powders, particles in solutions and fibers the material of the stub can interfere with backscattered electron [&hellip;]","og_url":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4\/","og_site_name":"Delta Microscopies","article_modified_time":"2022-03-15T15:10:56+00:00","og_image":[{"width":300,"height":300,"url":"https:\/\/www.deltamicroscopies.com\/wp-content\/uploads\/2018\/12\/D10-CC4025-EM-Tec_high_purity_carbon_HITACHI_SEM_pin_stub_diam55mm_M4.jpg","type":"image\/jpeg"}],"twitter_misc":{"Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4\/","url":"https:\/\/www.deltamicroscopies.com\/en\/products\/em-tec-high-purity-carbon-hitachi-sem-sample-stub-o25-x-6mm-x-m4\/","name":"EM-Tec high purity carbon Hitachi SEM sample stub, \u00d825 x 6mm x M4 - 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