Silicon Test Specimen for Incident LM

Description

This Test Specimen is made of a 5mmx5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide.

Cet échantillon de test est constitué d’un carré de silicium monocristallin de 5 mm x 5 mm. Il est photogravé et les carrés se répètent tous les 10µm. Les lignes de division ont une largeur de 1,9 µm.

A broader etching line is written every 500µm, which is useful in light microscopy. This is an excellent test specimen for comparing magnification and assessing any distortion in the image field. It is ideally useful in the context of automated counting systems to check for unsuspected distortions.
Where critical measurements must be made the sample can be mounted directly onto the calibration specimen so that an internal calibration is obtained on the micro-graph.

Technical Data Sheet : Silicone Test Specimen

Example Certificate Of Calibration