All products Standards - Delta Microscopies

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	Model 300-1D, AFM SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 300-1D, choose mount SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 300-1D, SEM Pin SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 300-1D, Unmounted SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 300-2D, AFM SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 300-2D, choose the mount SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 300-2D, SEM Pin SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 300-2D, Unmounted SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 301BE, SEM Pin SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 301CE, SEM Pin SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)

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