All products Standards - Delta Microscopies

Showing 1–150 of 175 results


	Model 150-1D, SEM pin SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 150-1D, Unmounted SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 150-2D, AFM Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)
	Model 150-2D, choose mount Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)
	Model 150-2D, SEM Pin Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)
	Model 150-2D, unmounted Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)
	Model 150-2DUTC, AFM Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)
	Model 150-2DUTC, choose mount Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)
	Model 150-2DUTC, SEM Pin Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)
	Model 150-2DUTC, unmounted Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)

1 … 8 9 10 … 18

0