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Delta Microscopies

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Scale Marker
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SEM Aluminum-Tungsten Dendrites Test
each
SEM Custom Sample Holder
SEM Custom Sample Holder
POR
Silicon Test Specimen for Incident LM
each Available for SEM and LM
Silicon Test Specimen on 12.5mm Pin Stub
each Available for SEM and LM
Silicon Test Specimen, Unmounted
each Available for SEM and LM
SPM, AFM, SEM Calibration Standards
SPM, AFM, SEM Calibration Standards
Magnification Reference Standards - SPM, AFM, SEM Calibration StandardsA series of calibration standards with one…
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Magnification Reference Standards - SPM, AFM, SEM Calibration StandardsA series of calibration standards with one and two dimension calibrated patterns. The standards come in two grid spacings – 300 nanometers and 700 nanometers. These standardsare created utilizing holographic interference of a particular laser frequency. They are typically accurate to <1% across the entire surface of the standard.
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Standard Test Specimen
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Standards de calibration à faible grossissement MEB et Microscopie optique
Low Magnification Calibration Standards and Color Calibration Slides Available for SEM and LM   Spécimen…
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Low Magnification Calibration Standards and Color Calibration Slides Available for SEM and LM   Spécimen de test de silicium Cet échantillon de test est constitué d’un carré de silicium monocristallin de 5 mm x 5 mm. Il est photo gravé et les carrés se répètent tous les 10µm. Les lignes de division ont une largeur […]
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Sulphide Minerals / Oxide Heavy Metals Standards Block
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