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The Micro-Tec MTC-5F bright field multiple target calibration standard comprises accurately deposited bright chromium lines… Show more (+) The Micro-Tec MTC-5F bright field multiple target calibration standard comprises accurately deposited bright chromium lines on a conductive ultra-flat silicon substrate. The MTC-5F has been designed for calibrating reflective light microscopes, stereo microscopes, optical quality control systems and low magnification SEM imaging. The Micro-Tec MTC-5F incorporates four distinct patterns:
Circle patterns from 5µm to 5mm diameter
Square patterns from 5x5µm to 5x5mm
Hexagon patterns from 5µm to 5mm across
Cross scale patterns of 5x5mm with 0.002mm divisions
The four chromium deposited patterns all in the same focus plane and provide a more superior signal compared to etched patterns.
The Micro-Tec MTC-5F is a NIST traceable standard.
Example of wafer level certificate of traceability for the Micro-Tec MTC-5F multiple target calibration standard. Show less (-) |
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Particle-size standards are certified for mean diameter and are traceable to the National Bureau of… Show more (+) Particle-size standards are certified for mean diameter and are traceable to the National Bureau of Standards (NBS). Duke Scientific's new line of standards in the submicrometer size range is called Nanosphere Size Standards™, and Monosized Polymer Microspheres.Capacity 15ml Show less (-) |
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The set is comprised of 28 minerals
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The set is comprised of 28 minerals
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-) |
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-) |
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-) |
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-) |
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Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-) |
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Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-) |
