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JEOL 100CX Standard Holder in brass for use in the STEM mode. Holds up to… Show more (+) JEOL 100CX Standard Holder in brass for use in the STEM mode. Holds up to 7 standards of your choice. Show less (-) |
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NIOPROBE The Nioprobe device is used to determine the shape at the very apex of… Show more (+) NIOPROBE The Nioprobe device is used to determine the shape at the very apex of the tip probe for microscopy. The Problem The physical probe used in AFM imaging is not ideally sharp. As a consequence, an AFM image does not reflect the true sample topography impartially, but rather represents the interaction of the tip […] Show less (-) |
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TIPCHECK The Tipcheck device is used for examining the shaft of the tip probe or… Show more (+) TIPCHECK The Tipcheck device is used for examining the shaft of the tip probe or for determining the tip breakage etc. The Problem When imaging a new sample in an AFM, it may be difficult to know whether one has obtained an accurate representation of the surface. Even in the case that a fairly clear […] Show less (-) |
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Backscattered Electron Detector Calibration Standard
30mm x 5mm Carbon Block
Checks Detector and SEM Performance.
… Show more (+) Backscattered Electron Detector Calibration Standard
30mm x 5mm Carbon Block
Checks Detector and SEM Performance.
Certified Standards For System Calibration.
Contains:
- Standards to check 1 Atomic number resolution.
- Faraday Cup to set probe current.
- Duplex Brass to check 0.1 Atomic number resolution Show less (-) |
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A set of 18 standards, a Faraday Cup included. Mounted in 25mm or 32mm dia… Show more (+) A set of 18 standards, a Faraday Cup included. Mounted in 25mm or 32mm dia. brass block. Show less (-) |
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Available for SEM and LM |
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