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The EM-Tec MCS-0.1 calibration standard has been developed to accurately calibrate SEM, FESEM, FIB… Show more (+) The EM-Tec MCS-0.1 calibration standard has been developed to accurately calibrate SEM, FESEM, FIB, Auger, SIMS and reflected light microscope systems. Suitable for magnifications from 10x to 200,000x. Bright chromium deposited features on ultra-flat conductive silicon for calibration down to 2.5µm and gold over chromium for 1µm to 100nm calibration features. The metal lines on silicon exhibit excellent signal with high contrast. The feature sizes for the MCS-0.1 are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm, 1µm, 500nm, 250nm and 100nm. The 31-T32000 EM-Tec MCS-0.1TR is NIST traceable on the wafer level against a NIST calibrated standard. Offered unmounted or mounted on the most popular SEM stubs. Good alternative for the discontinued SIRA calibration standard.
Example of wafer level certificate of traceability for the EM-Tec MCS-0.1TR magnification calibration standard, 2.5mm to 100nm. Show less (-) |
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The EM-Tec MCS-0.1-XY calibration standard has been developed to accurately calibrate SEM, FESEM, FIB… Show more (+) The EM-Tec MCS-0.1-XY calibration standard has been developed to accurately calibrate SEM, FESEM, FIB, Auger and SIMS systems. Suitable for magnifications from 10x to 200,000x. Bright chromium deposited features on ultra-flat conductive silicon for calibration down to 2.5µm and gold over chromium for 1µm to 100nm calibration features. The metal lines on silicon exhibit excellent signal with high contrast. The feature sizes for the MCS-0.1-XY are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm, 1µm, 500nm, 250nm and 100nm in both X and Y direction. The 31-T32040 EM-Tec MCS-0.1TR-XY is NIST traceable on the wafer level against a NIST calibrated standard. Offered unmounted or mounted on the most popular SEM stubs. Good alternative for the discontinued SIRA calibration standard. Show less (-) |
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The EM-Tec MCS-1 calibration standard has been developed to accurately calibrate table top SEM, reflected… Show more (+) The EM-Tec MCS-1 calibration standard has been developed to accurately calibrate table top SEM, reflected light microscopes, compact SEMs and the low to medium magnification range of standard SEMs. Suitable for magnifications from 10x to 20,000x. Bright chromium deposited features on ultra-flat conductive silicon. The feature sizes for the MCS-1 are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm and 1µm.
The 31-C31000 EM-Tec MCS-1CF is individually certified utilizing a NIST measured calibration standard. Offered unmounted or mounted on the most popular SEM stubs.
Example of individual certificate of calibration for the EM-Tec MCS-1CF certified magnification calibration standard, 2.5mm to 1µm. Show less (-) |
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The EM-Tec MCS-1-XY calibration standard has been developed to accurately calibrate table top SEM, reflected… Show more (+) The EM-Tec MCS-1-XY calibration standard has been developed to accurately calibrate table top SEM, reflected light microscopes, compact SEMs and the low to medium magnification range of standard SEMs. Suitable for magnifications from 10x to 20,000x. Bright chromium deposited features on ultra-flat conductive silicon. The feature sizes for the MCS-1-XY are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm and 1µm in both X and Y direction.
The 31-C31000 EM-Tec MCS-1CF-XY is individually certified utilizing a NIST measured calibration standard. Offered unmounted or mounted on the most popular SEM stubs. Show less (-) |
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he EM-Tec MCS-1 calibration standard has been developed to accurately calibrate table top SEM, reflected… Show more (+) he EM-Tec MCS-1 calibration standard has been developed to accurately calibrate table top SEM, reflected light microscopes, compact SEMs and the low to medium magnification range of standard SEMs. Suitable for magnifications from 10x to 20,000x. Bright chromium deposited features on ultra-flat conductive silicon. The feature sizes for the MCS-1 are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm and 1µm.
The 31-T31000 EM-Tec MCS-1TR is traceable on the wafer level against a NIST measured calibration standard. Offered unmounted or mounted on the most popular SEM stubs.
Example of wafer level certificate of traceability for the EM-Tec MCS-1TR magnification calibration standard, 2.5mm to 1µm. Show less (-) |
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The EM-Tec MCS-1-XY calibration standard has been developed to accurately calibrate table top SEM, reflected… Show more (+) The EM-Tec MCS-1-XY calibration standard has been developed to accurately calibrate table top SEM, reflected light microscopes, compact SEMs and the low to medium magnification range of standard SEMs. Suitable for magnifications from 10x to 20,000x. Bright chromium deposited features on ultra-flat conductive silicon. The feature sizes for the MCS-1-XY are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm and 1µm in X and Y direction.
The 31-T31000 EM-Tec MCS-1TR-XY is traceable on the wafer level against a NIST measured calibration standard. Offered unmounted or mounted on the most popular SEM stubs. Show less (-) |
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Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere… Show more (+) Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere size range is 5nm – 30um. Carbon substrate size is 6mm diameter with 2mm height. Due to the large range of sphere sizes this test specimen is ideally suited for a wide range of magnifications and operating voltage. Can be used from low magnifications as low as 100x and zoom in on the smaller spheres for higher magnifications. The nearly perfect round spheres make it easy to Ideal for for resolution testing on standard SEMs. Use at 15,000x magnification or higher. Easy to use resolution specimen for standard SEMs, table top SEMs and training purposes. Excellent tool to test performance and optimize your SEM after a filament change.
Available unmounted or mounted on the most popular SEM stubs. If you work with multiple SEM platforms, look at our SEM stub adapter page. The SEM stub adapters enable you to use a single resolution standard on all SEMs. Show less (-) |
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Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere… Show more (+) Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere size range is 5nm – 30um. Carbon substrate size is 6mm diameter with 2mm height. Due to the large range of sphere sizes this test specimen is ideally suited for a wide range of magnifications and operating voltage. Can be used from low magnifications as low as 100x and zoom in on the smaller spheres for higher magnifications. The nearly perfect round spheres make it easy to Ideal for for resolution testing on standard SEMs. Use at 15,000x magnification or higher. Easy to use resolution specimen for standard SEMs, table top SEMs and training purposes. Excellent tool to test performance and optimize your SEM after a filament change.
Available unmounted or mounted on the most popular SEM stubs. If you work with multiple SEM platforms, look at our SEM stub adapter page. The SEM stub adapters enable you to use a single resolution standard on all SEMs. Show less (-) |
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L'étalon d'étalonnage EM-Tec MCS-0.1-XY a été développé pour calibrer avec la plus grande précision… Show more (+) L'étalon d'étalonnage EM-Tec MCS-0.1-XY a été développé pour calibrer avec la plus grande précision les systèmes SEM, FESEM, FIB, Auger et SIMS. Convient aux grossissements de 10x à 200 000x. Caractéristiques déposées de chrome brillant sur du silicium conducteur ultra-plat pour un étalonnage jusqu'à 2,5 µm et d'or sur chrome pour des caractéristiques d'étalonnage de 1 µm à 100 nm dans les directions X et Y. Les lignes métalliques sur silicium présentent un excellent signal avec un contraste élevé. Les tailles de fonctionnalités du MCS-0.1-XY sont :
2,5 mm, 1,0 mm, 0,5 mm, 250 µm, 100 µm, 10 µm, 5 µm, 2,5 µm, 1 µm, 500 nm, 250 nm et 100 nm dans les directions X et Y. Le 31-C32000 EM-Tec MCS-0.1CF-XY est certifié individuellement à l'aide d'une norme calibrée NIST. Proposé démonté ou monté sur les stubs SEM les plus populaires. Excellente alternative à l'étalon d'étalonnage SIRA abandonné avec des tailles de fonctionnalités compatibles plus faciles à utiliser. Excellente alternative à l'étalon d'étalonnage SIRA abandonné avec des tailles de fonctionnalités compatibles plus faciles à utiliser, voir TSB 31-C32000 EM-Tec MCS-0.1CF replacement for SIRA calibration standard Show less (-) |
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L'étalon d'étalonnage EM-Tec MCS-1-XY a été développé pour calibrer avec précision les SEM de table… Show more (+) L'étalon d'étalonnage EM-Tec MCS-1-XY a été développé pour calibrer avec précision les SEM de table, les microscopes à lumière réfléchie, les SEM compacts et la plage de grossissement faible à moyen des SEM standard. Convient aux grossissements de 10x à 20 000x. Caractéristiques déposées de chrome brillant sur du silicium conducteur ultra-plat. Les tailles des caractéristiques du MCS-1-XY sont :
2,5 mm, 1,0 mm, 0,5 mm, 250 µm, 100 µm, 10 µm, 5 µm, 2,5 µm et 1 µm dans les directions X et Y.
Le 31-C31000 EM-Tec MCS-1CF-XY est certifié individuellement à l'aide d'un étalon d'étalonnage mesuré NIST. Proposé démonté ou monté sur les stubs SEM les plus populaires. Show less (-) |
