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The EM-Tec MCS-0.1-XY calibration standard has been developed to accurately calibrate SEM, FESEM, FIB… Show more (+) The EM-Tec MCS-0.1-XY calibration standard has been developed to accurately calibrate SEM, FESEM, FIB, Auger and SIMS systems. Suitable for magnifications from 10x to 200,000x. Bright chromium deposited features on ultra-flat conductive silicon for calibration down to 2.5µm and gold over chromium for 1µm to 100nm calibration features. The metal lines on silicon exhibit excellent signal with high contrast. The feature sizes for the MCS-0.1-XY are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm, 1µm, 500nm, 250nm and 100nm in both X and Y direction. The 31-T32040 EM-Tec MCS-0.1TR-XY is NIST traceable on the wafer level against a NIST calibrated standard. Offered unmounted or mounted on the most popular SEM stubs. Good alternative for the discontinued SIRA calibration standard. Show less (-) |
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The EM-Tec MCS-1 calibration standard has been developed to accurately calibrate table top SEM, reflected… Show more (+) The EM-Tec MCS-1 calibration standard has been developed to accurately calibrate table top SEM, reflected light microscopes, compact SEMs and the low to medium magnification range of standard SEMs. Suitable for magnifications from 10x to 20,000x. Bright chromium deposited features on ultra-flat conductive silicon. The feature sizes for the MCS-1 are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm and 1µm.
The 31-C31000 EM-Tec MCS-1CF is individually certified utilizing a NIST measured calibration standard. Offered unmounted or mounted on the most popular SEM stubs.
Example of individual certificate of calibration for the EM-Tec MCS-1CF certified magnification calibration standard, 2.5mm to 1µm. Show less (-) |
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The EM-Tec MCS-1-XY calibration standard has been developed to accurately calibrate table top SEM, reflected… Show more (+) The EM-Tec MCS-1-XY calibration standard has been developed to accurately calibrate table top SEM, reflected light microscopes, compact SEMs and the low to medium magnification range of standard SEMs. Suitable for magnifications from 10x to 20,000x. Bright chromium deposited features on ultra-flat conductive silicon. The feature sizes for the MCS-1-XY are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm and 1µm in both X and Y direction.
The 31-C31000 EM-Tec MCS-1CF-XY is individually certified utilizing a NIST measured calibration standard. Offered unmounted or mounted on the most popular SEM stubs. Show less (-) |
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he EM-Tec MCS-1 calibration standard has been developed to accurately calibrate table top SEM, reflected… Show more (+) he EM-Tec MCS-1 calibration standard has been developed to accurately calibrate table top SEM, reflected light microscopes, compact SEMs and the low to medium magnification range of standard SEMs. Suitable for magnifications from 10x to 20,000x. Bright chromium deposited features on ultra-flat conductive silicon. The feature sizes for the MCS-1 are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm and 1µm.
The 31-T31000 EM-Tec MCS-1TR is traceable on the wafer level against a NIST measured calibration standard. Offered unmounted or mounted on the most popular SEM stubs.
Example of wafer level certificate of traceability for the EM-Tec MCS-1TR magnification calibration standard, 2.5mm to 1µm. Show less (-) |
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The EM-Tec MCS-1-XY calibration standard has been developed to accurately calibrate table top SEM, reflected… Show more (+) The EM-Tec MCS-1-XY calibration standard has been developed to accurately calibrate table top SEM, reflected light microscopes, compact SEMs and the low to medium magnification range of standard SEMs. Suitable for magnifications from 10x to 20,000x. Bright chromium deposited features on ultra-flat conductive silicon. The feature sizes for the MCS-1-XY are:
2.5mm, 1.0mm, 0.5mm, 250µm, 100µm, 10µm, 5µm, 2.5µm and 1µm in X and Y direction.
The 31-T31000 EM-Tec MCS-1TR-XY is traceable on the wafer level against a NIST measured calibration standard. Offered unmounted or mounted on the most popular SEM stubs. Show less (-) |
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Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere… Show more (+) Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere size range is 5nm – 30um. Carbon substrate size is 6mm diameter with 2mm height. Due to the large range of sphere sizes this test specimen is ideally suited for a wide range of magnifications and operating voltage. Can be used from low magnifications as low as 100x and zoom in on the smaller spheres for higher magnifications. The nearly perfect round spheres make it easy to Ideal for for resolution testing on standard SEMs. Use at 15,000x magnification or higher. Easy to use resolution specimen for standard SEMs, table top SEMs and training purposes. Excellent tool to test performance and optimize your SEM after a filament change.
Available unmounted or mounted on the most popular SEM stubs. If you work with multiple SEM platforms, look at our SEM stub adapter page. The SEM stub adapters enable you to use a single resolution standard on all SEMs. Show less (-) |
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Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere… Show more (+) Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere size range is 5nm – 30um. Carbon substrate size is 6mm diameter with 2mm height. Due to the large range of sphere sizes this test specimen is ideally suited for a wide range of magnifications and operating voltage. Can be used from low magnifications as low as 100x and zoom in on the smaller spheres for higher magnifications. The nearly perfect round spheres make it easy to Ideal for for resolution testing on standard SEMs. Use at 15,000x magnification or higher. Easy to use resolution specimen for standard SEMs, table top SEMs and training purposes. Excellent tool to test performance and optimize your SEM after a filament change.
Available unmounted or mounted on the most popular SEM stubs. If you work with multiple SEM platforms, look at our SEM stub adapter page. The SEM stub adapters enable you to use a single resolution standard on all SEMs. Show less (-) |
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The Micro-Tec MTC-5F bright field multiple target calibration standard comprises accurately deposited bright chromium lines… Show more (+) The Micro-Tec MTC-5F bright field multiple target calibration standard comprises accurately deposited bright chromium lines on a conductive ultra-flat silicon substrate. The MTC-5F has been designed for calibrating reflective light microscopes, stereo microscopes, optical quality control systems and low magnification SEM imaging. The Micro-Tec MTC-5F incorporates four distinct patterns:
Circle patterns from 5µm to 5mm diameter
Square patterns from 5x5µm to 5x5mm
Hexagon patterns from 5µm to 5mm across
Cross scale patterns of 5x5mm with 0.002mm divisions
The four chromium deposited patterns all in the same focus plane and provide a more superior signal compared to etched patterns.
The Micro-Tec MTC-5F is a NIST traceable standard.
Example of wafer level certificate of traceability for the Micro-Tec MTC-5F multiple target calibration standard. Show less (-) |
