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Supprimer l’élément Miniature Produit Prix Quantité Sous-total
× EM-Tec GS24 gripping stub holder with clamping plate, 0-4mm, aluminium, M4 EM-Tec GS24 gripping stub holder with clamping plate, 0-4mm, aluminium, M4 (Ref: D12-000334)
× EM-Tec CS9/4 C-Square multi pin stub holder for 9x Ø12.7mm or 4 x Ø25.4mm pin stubs, Ø14mm JEOL stub EM-Tec CS9/4 C-Square multi pin stub holder for 9x Ø12.7mm or 4 x Ø25.4mm pin stubs, Ø14mm JEOL stub (Ref: D12-006332)
× EM-Tec FS2Z sampler with Ø25.4mm short Zeiss pin stub and Ø25mm high purity conductive tab in a SB3 storage tube EM-Tec FS2Z sampler with Ø25.4mm short Zeiss pin stub and Ø25mm high purity conductive tab in a SB3 storage tube (Ref: D15-008302)
× EM-Tec FS12Z box with 10 x Ø12.7mm short Zeiss pin stubs plus Ø12mm high purity conductive tabs in SB2 storage tubes EM-Tec FS12Z box with 10 x Ø12.7mm short Zeiss pin stubs plus Ø12mm high purity conductive tabs in SB2 storage tubes (Ref: D15-008312)
× EM-Tec FS1Z sampler with Ø12.7mm short Zeiss pin stub and Ø12mm high purity conductive tab in a SB2 storage tube EM-Tec FS1Z sampler with Ø12.7mm short Zeiss pin stub and Ø12mm high purity conductive tab in a SB2 storage tube (Ref: D15-008301)
× EM-Tec JV60P versatile dovetail SEM stage adapter for pin stubs for JEOL SEMs 6610, 6490, 6480, 6460, 5910, 5900, 5800 and JIB 4500 FIB/SEM EM-Tec JV60P versatile dovetail SEM stage adapter for pin stubs for JEOL SEMs 6610, 6490, 6480, 6460, 5910, 5900, 5800 and JIB 4500 FIB/SEM (Ref: D11-000563)
× EM-Tec JS19 swivel clamp for up to 16mm samples, aluminium, JEOL Ø12.2mm EM-Tec JS19 swivel clamp for up to 16mm samples, aluminium, JEOL Ø12.2mm (Ref: D12-005215)
× EM-Tec H10 Hitachi M4 stub extender 10mm fixed, Ø15x14mm, M4 EM-Tec H10 Hitachi M4 stub extender 10mm fixed, Ø15x14mm, M4 (Ref: D11-000309)

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