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We offer a comprehensive choice of standard pin stubs to support virtually all applications. The… Show more (+) We offer a comprehensive choice of standard pin stubs to support virtually all applications. The standard SEM pin stubs are compatible with Thermo Fisher, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. They are made from vacuum grade aluminium. They are machined according to the original manufacturer's specifications and dimensions. The flat pin stubs from 12.7mm to 38mm diameter are grooved for easy and clean handling. The most used pin stubs are the Ø12.7 mm and the Ø25.4 mm pin stubs. Pins are all 3.2mm diameter with a length of either 8mm or 9.5mm. The Ø12.7 mm pin stubs are also available in brass, copper and high purity carbon. Show less (-) |
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use… Show more (+) The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8'') diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling. Show less (-) |
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use… Show more (+) The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8”) diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin […] Show less (-) |
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use… Show more (+) The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8”) diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin […] Show less (-) |
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We offer a comprehensive choice of standard pin stubs to support virtually all applications. The… Show more (+) We offer a comprehensive choice of standard pin stubs to support virtually all applications. The standard SEM pin stubs are compatible with Thermo Fisher, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. They are made from vacuum grade aluminium. They are machined according to the original manufacturer's specifications and dimensions. The flat pin stubs from 12.7mm to 38mm diameter are grooved for easy and clean handling. The most used pin stubs are the Ø12.7 mm and the Ø25.4 mm pin stubs. Pins are all 3.2mm diameter with a length of either 8mm or 9.5mm. The Ø12.7 mm pin stubs are also available in brass, copper and high purity carbon. Show less (-) |
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Well-designed Economy antistatic TEM grid box with a capacity of 100 the standard 3.05mm… Show more (+) Well-designed Economy antistatic TEM grid box with a capacity of 100 the standard 3.05mm TEM grids. Ideal for long term storage. Body with the 100 storage cavities is made of blue ABS with a clear acrylic sliding lid. Positions are referenced with numbers and letters, clearly printed on the body. The sliding lid has also 5 positions printed on the inside to enable easy location. Wider spacing of the cavities prevent confusion when loading and make retrieval easier. Dimensions of the EM-Tec TGB-100 TEM grid box are: 92 x 55 x 7mm. See our video o our channel YouTube "Microscopy Direct" Show less (-) |
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The same as Dial-A-Grid Module but with two additional cavities for block storage.
*BEEM® Is… Show more (+) The same as Dial-A-Grid Module but with two additional cavities for block storage.
*BEEM® Is A Registered Trademark of Better Equipment For Electron Microscopy, Inc. Show less (-) |
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Precious metal sputtering targets are made from high purity metals, starting 99.99% with most… Show more (+) Precious metal sputtering targets are made from high purity metals, starting 99.99% with most standard disc sizes, for use on most sputtering units from many manufacturers: Emitech, Emscope, Bio-Rad, Polaron, Edwards, Balzers, Plasma Sciences, Technics Hummers, Denton, Cressington, and much more. Show less (-) |
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Precious metal sputtering targets are made from high purity metals, starting 99.99% with most… Show more (+) Precious metal sputtering targets are made from high purity metals, starting 99.99% with most standard disc sizes, for use on most sputtering units from many manufacturers: Emitech, Emscope, Bio-Rad, Polaron, Edwards, Balzers, Plasma Sciences, Technics Hummers, Denton, Cressington, and much more. Show less (-) |
