Showing 1–150 of 363 results
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Hitachi -TM-table Topmicroscope (146)
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JEOL and Neoscope (118)
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PHILIPS and Phenom (16)
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Zeiss (60)
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Other accessories (18)
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3x EM-Tec replacement TEM grid clips for EM-Tec t-EBSD holders plus 3 x M2x3mm brass screw
Pkg/3
Ref: D12-002270
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45 degree angled Zeiss pin stub Ø12.7 diameter, short pin, aluminium
Ref: D10-003204
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
45 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8”) diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling.
Ref: D10-003205
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
45/90 degree angled Zeiss pin stub Ø12.7 diameter, short pin, aluminium
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8”) diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling.
Ref: D10-003206
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
Ref: D10-003209
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
45/90 degree angled Zeiss pin stub Ø32mm diameter, short pin, aluminium
Ref: D10-003234
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
5 each EM-Tec copper alloy S-Clips with 5 each brass M2x3mm screws
pkg/5
Ref: D12-000900
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6 each EM-Tec S-Clip stand-off pillars, 4mm height, brass, M2x3 male/female
set/6
Ref: D12-000904
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AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs
Box/10
Ref: D14-AE1201
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AmRay Filament for all AmRay, AMR and Leitz/AMR SEMs, except AMR 1200 series
Box/10
Ref: D14-AM1202
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Cambridge S4 type SEM stub Ø32mm, aluminium
Ref: D10-000004
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
Conductive Lift-N-Press double sided adhesive tabs, Ø12.5mm
pkg/100
Ref: D15-000401
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Double 45/90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8”) diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling
Ref: D10-003207
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
Double 90 degree angled Zeiss pin stub Ø25.4 diameter, short pin, aluminium
Ref: D10-003208
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
Double 90 degree angled Zeiss pin stub Ø32mm diameter, short pin, aluminium
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8”) diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling
Ref: D10-003233
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
EBSD-3D sample holder for FEI / Thermo Dualbeam Systems, aluminium, M6 fine thread
Ref: D12-000736
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
EM-Tec 127G.AM SEM pin stub gripper tweezers for Ø12.7mm pin stubs, anti-magnetic stainless steel
each
Ref: D50-050012
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EM-Tec 150.AM SEM stub gripper tweezers for Ø15mm cylinder stubs, anti-magnetic stainless steel
each
Ref: D50-050150
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EM-Tec 190G.AM SEM pin stub gripper tweezers for Ø19mm pin stubs, anti-magnetic stainless steel
each
Ref: D50-050019
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EM-Tec 250.AM SEM stub gripper tweezers for Ø25mm cylinder stubs, anti-magnetic stainless steel
each
Ref: D50-050250
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EM-Tec 320.AM SEM stub gripper tweezers for Ø32mm cylinder stubs, anti-magnetic stainless steel
each
Ref: D50-050320
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EM-Tec 521.AM Gatan 3View stub handling tweezers, 118mm, anti-magnetic stainless steel
each
Ref: D50-001521
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EM-Tec 5B.AM high precision tweezers, style 5B, extra fine bent tips, anti-magnetic stainless steel
each
Ref: D50-001055
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EM-Tec 7.AM high precision tweezers, style 7, very fine curved tips, anti-magnetic stainless steel
each
Ref: D50-001070
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EM-Tec 95.AM SEM stub gripper tweezers for Ø9.5mm cylinder stubs, anti-magnetic stainless steel
each
Ref: D50-050110
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EM-Tec B26 bulk sample holder for up 26mm, aluminium, M4
each
Ref: D12-000325
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EM-Tec B26 bulk sample holder for up 26mm, aluminium, Ø14mm JEOL stub
each
Ref: D12-000625
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EM-Tec B38 bulk sample holder for up 38mm, aluminium, Ø14mm JEOL stub
each
Ref: D12-000627
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EM-Tec B52 bulk sample holder for up 52mm, aluminium, Ø14mm JEOL stub
each
Ref: D12-006252
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EM-Tec CS16/4 C-Square multi pin stub holder for 16x Ø12.7mm or 4 x Ø25.4mm pin stubs, Ø14mm JEOL stub
each
Ref: D12-006333
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EM-Tec CS25/4 C-Square multi pin stub holder for 25x Ø12.7mm or 4x or 9x Ø25.4mm pin stubs, Ø14mm JEOL stub
each
Ref: D12-006334
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EM-Tec CS36/9 C-Square multi pin stub holder for 36x Ø12.7mm or 9 x Ø25.4mm pin stubs, Ø14mm JEOL stub
each
Ref: D12-006335
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EM-Tec CS49/9 C-Square multi pin stub holder for 49x Ø12.7mm or 9 x Ø25.4mm pin stubs, Ø14mm JEOL stub
each
Ref: D12-006336
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EM-Tec CS64/16 C-Square multi pin stub holder for 64x Ø12.7mm or 16x Ø25.4mm pin stubs, Ø14mm JEOL stub
each
Ref: D12-006337
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EM-Tec CS9/4 C-Square multi pin stub holder for 9x Ø12.7mm or 4 x Ø25.4mm pin stubs, Ø14mm JEOL stub
Ref: D12-006332
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EM-Tec CT12 high purity conductive double sided adhesive carbon tabs, Ø12mm
pkg/100
Ref: D15-000412
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EM-Tec CT25 high purity conductive double sided adhesive carbon tabs, Ø25mm
pkg/50
Ref: D15-000425
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EM-Tec CT6 high purity conductive double sided adhesive carbon tabs, Ø6mm
pkg/108
Ref: D15-000406
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EM-Tec CT9 high purity conductive double sided adhesive carbon tabs, Ø9mm
pkg/104
Ref: D15-000409
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EM-Tec CV1 centering vise SEM sample holder for up to 110mm, Ø14mm JEOL stub
each
Ref: D12-000602
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EM-Tec double sided conductive copper SEM tape 12mm x 33m
each
Ref: D15-000212
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EM-Tec double sided conductive copper SEM tape 6mm x 33m
each
Ref: D15-000206
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EM-Tec F12Z compact FIB grid holder for up to 2 FIB grids, short Zeiss pin
each
Ref: D12-003270
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EM-Tec F13 filter disc holder for Ø13mm filters, Ø14mm JEOL stub
each
Ref: D12-000683
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EM-Tec F25 filter disc holder for Ø25mm filters, Ø14mm JEOL stub
each
Ref: D12-000685
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EM-Tec F35 filter disc holder for Ø35mm filters, Ø14mm JEOL stub
each
Ref: D12-000691
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EM-Tec F47 filter disc holder for Ø47mm filters, Ø14mm JEOL stub
each
Ref: D12-000687
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EM-Tec FG-1 Silicon Finder Grid Substrate with 144 fields of 1x1mm
each
Ref: D10-008144
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EM-Tec FS10Z box with 10 x Ø12.7mm short Zeiss pin stubs in SB2 storage tubes (no tabs)
each
Ref: D15-008310
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EM-Tec FS12Z box with 10 x Ø12.7mm short Zeiss pin stubs plus Ø12mm high purity conductive tabs in SB2 storage tubes
each
Ref: D15-008312
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EM-Tec FS1Z sampler with Ø12.7mm short Zeiss pin stub and Ø12mm high purity conductive tab in a SB2 storage tube
each
Ref: D15-008301
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EM-Tec FS20Z box with 10 x Ø25.4mm short Zeiss pin stubs in SB3 storage tubes (no tabs)
each
Ref: D15-008320
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EM-Tec FS25Z box with 10 x Ø25.4mm short Zeiss pin stubs plus Ø25mm high purity conductive tabs in SB3 storage tubes
each
Ref: D15-008325
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EM-Tec FS2Z sampler with Ø25.4mm short Zeiss pin stub and Ø25mm high purity conductive tab in a SB3 storage tube
each
Ref: D15-008302
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EM-Tec FV24 versatile SEM stage adapter assembly for FEI/Philips with M4 screw, M6Fx20mm
each
Ref: D11-000224
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EM-Tec FV44 versatile SEM stage adapter assembly for FEI/Philips with M4 screw, M6Fx40mm
each
Ref: D11-000244
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EM-Tec FV54 versatile SEM stage adapter assembly for FEI/Philips with M4 screw, M6Fx50mm
each
Ref: D11-000254
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EM-Tec G0 universal thin section and slide holder for up to 75x50mm slides, Ø14mm JEOL stub
each
Ref: D12-000660
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EM-Tec G2 twin geological thin sections holder for 2 petrographic slides up to 28x48mm, Ø14mm JEOL stub
each
Ref: D12-006262
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EM-Tec G4.0 geological thin section holder for 4 petrographic slides up to 28x48mm, Ø14mm JEOL stub
each
Ref: D12-006264
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EM-Tec GB16 bulk sample holder for up 16mm, gilded brass, M4
each
Ref: D12-000323
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EM-Tec GR20 bulk sample holder for up to Ø20mm, gilded brass, M4
each
Ref: D12-000317
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EM-Tec GS24 gripping stub holder with clamping plate, 0-4mm, aluminium, M4
each
Ref: D12-000334
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EM-Tec GZM4 compact Zeiss pin stub adapter with M4 thread, gold plated brass, short Zeiss pin
each
Ref: D11-000102
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EM-Tec H10 Hitachi M4 stub extender 10mm fixed, Ø15x14mm, M4
each
Ref: D11-000309
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EM-Tec H15P M4 adapter for pin stub, Ø15x16mm, M4
each
Ref: D11-000304
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EM-Tec H3 multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x6mm, M4
each
Ref: D12-000356
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EM-Tec H3 multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x6mm, pin
each
Ref: D12-000256
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EM-Tec H3/45 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x14mm, M4
each
Ref: D12-000342
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EM-Tec H3/45 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs, Ø25x14mm, pin
each
Ref: D12-000242
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EM-Tec H3/45R 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs with individual rotation, Ø25x14mm, M4
each
Ref: D12-000344
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EM-Tec H3/45R 45 degrees multi stub holder for 3 x Ø15mm Hitachi stubs with individual rotation, Ø25x14mm, pin
each
Ref: D12-000244
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EM-Tec H3L multi stub holder for 3 x Ø25mm Hitachi stubs, Ø50x6mm, M4
each
Ref: D12-000357
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EM-Tec H3L multi stub holder for 3 x Ø25mm Hitachi stubs, Ø50x6mm, pin
each
Ref: D12-000257
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EM-Tec H45 fixed 45° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x17mm, M4
each
Ref: D12-000341
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EM-Tec H45P fixed 45° pre-tilt holder for pin stubs/holders, Ø12.7x17mm, M4
each
Ref: D12-000345
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EM-Tec H6 multi stub holder for 6 x Ø15mm Hitachi stubs, Ø50x6mm, M4
each
Ref: D12-000358
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EM-Tec H6 multi stub holder for 6 x Ø15mm Hitachi stubs, Ø50x6mm, pin
each
Ref: D12-000258
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EM-Tec H6/45 45 degrees multi stub holder for 6 x Ø15mm Hitachi stubs, Ø35x14mm, M4
each
Ref: D12-000338
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EM-Tec H6/45 45 degrees multi stub holder for 6 x Ø15mm Hitachi stubs, Ø35x14mm, pin
each
Ref: D12-000247
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EM-Tec H6/45R 45 degrees multi stub holder for 6 x Ø15mm Hitachi stubs with individual rotation, Ø35x14mm, M4
each
Ref: D12-000339
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EM-Tec H6/45R 45 degrees multi stub holder for 6 x Ø15mm Hitachi stubs with individual rotation, Ø35x14mm, pin
each
Ref: D12-000245
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EM-Tec H70 EBSD 70° pre-tilt holder for Hitachi M4 stubs/holders, Ø12.7x20mm, M4
each
Ref: D12-000371
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EM-Tec HGS10 swivel head sample holder for up to 10mm, gold plated brass, M4
each
Ref: D12-003110
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EM-Tec high purity carbon Hitachi SEM sample stub, Ø15 x 6mm x M4
each
Ref: D10-CC4015
Read MoreSelect options This product has multiple variants. The options may be chosen on the product page -
EM-Tec high purity carbon Hitachi SEM sample stub, Ø25 x 6mm x M4
Ref: D10-CC4025