stub

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EM-Tec HS15 Hitachi stub swivel mount, Ø15x21mm, aluminium, M4

each

Ref: D12-003211
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Hitachi Ø25x16mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

The standard Hitachi stubs use an M 4 threaded hole in the base of the stubs. Our comprehensive selection of Hitachi M4 sample stubs include sizes from 15mm up to 100mm diameter to support virtually all applications. The Hitachi M4 SEM sample stubs are all made from vacuum grade aluminium. They are manufactured according to the original Hitachi specifications and are fully compatible with the standard Hitachi sample stub holders and stage adapters.

Ref: D10-004229
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit
Hitachi Ø25x16mm M4 angled SEM sample stub, double 90 degree, aluminium

The standard Hitachi stubs use an M 4 threaded hole in the base of the stubs. Our comprehensive selection of Hitachi M4 sample stubs include sizes from 15mm up to 100mm diameter to support virtually all applications. The Hitachi M4 SEM sample stubs are all made from vacuum grade aluminium. They are manufactured according to the original Hitachi specifications and are fully compatible with the standard Hitachi sample stub holders and stage adapters.

Ref: D10-004228
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit
JEOL Dish stub, Ø12.2×10 with 1.5mm dish depth, aluminium

Ref: D10-005114
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit
JEOL Ø12.2x10mm angled SEM sample stub with 45 and 90 degree, aluminium

Ref: D10-005119
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit
JEOL Ø12.2x10mm angled SEM sample stub with 45 degree, aluminium

Ref: D10-005115
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit
JEOL Ø25x16mm angled SEM sample stub with 45 and 90 degree, aluminium

Ref: D10-005219
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit
JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium

Ref: D10-005127
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit
JEOL Ø25x16mm angled SEM sample stub with double 90 degree, aluminium

Ref: D10-005225
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit
JEOL Ø9.5×9.5mm angled SEM sample stub with 45 and 90 degree, aluminium

Ref: D10-005125
Read More Choix des options Ce produit a plusieurs variations. Les options peuvent être choisies sur la page du produit

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stub

EM-Tec HS15 Hitachi stub swivel mount, Ø15x21mm, aluminium, M4

each

Hitachi Ø25x16mm M4 angled SEM sample stub, 45 and 90 degree, aluminium

Hitachi Ø25x16mm M4 angled SEM sample stub, double 90 degree, aluminium

JEOL Dish stub, Ø12.2×10 with 1.5mm dish depth, aluminium

JEOL Ø12.2x10mm angled SEM sample stub with 45 and 90 degree, aluminium

JEOL Ø12.2x10mm angled SEM sample stub with 45 degree, aluminium

JEOL Ø25x16mm angled SEM sample stub with 45 and 90 degree, aluminium

JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium

JEOL Ø25x16mm angled SEM sample stub with double 90 degree, aluminium

JEOL Ø9.5×9.5mm angled SEM sample stub with 45 and 90 degree, aluminium

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