JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium

REF: D10-005127 Categories: Accessoires divers, Accessoires par marque de microscope, Holders, plots, pin, JEOL and Neoscope, Scanning Electron Microscope, Support & Adaptateurs Étiquettes : JEOL, stub Brand: Jeol

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JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium

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JEOL Ø25x16mm angled SEM sample stub with 45 degree, aluminium

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