FEI Teneo VolumeScope pin stubs with V groove

The FEI Teneo VolumeScope systems uses specially designed sample stubs with a 3.1mm diameter pin. The sample mounted on these pins are used for serial sectioning and serial block-face BSD imaging to create 3D imaging data of the sample structure. The sample area consists of a raised platform with 2mm diameter which sits on a Ø8mm head. To improve handling of the FEI Teneo VS pins, we have added a groove in the side of the Ø8mm head. With the groove, the FEI VS Teneo pins can be easily handled, removed from the sample holder and placed in storage boxes.
These pin stubs are fully compatible with the FEI Teneo VS SEM system; Ø3.1mm pin, Ø8mm head and raised platform for sample mounting. Manufactured from vacuum grade aluminium.

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Description

The FEI Teneo VolumeScope systems uses specially designed sample stubs with a 3.1mm diameter pin. The sample mounted on these pins are used for serial sectioning and serial block-face BSD imaging to create 3D imaging data of the sample structure. The sample area consists of a raised platform with 2mm diameter which sits on a Ø8mm head. To improve handling of the FEI Teneo VS pins, we have added a groove in the side of the Ø8mm head. With the groove, the FEI VS Teneo pins can be easily handled, removed from the sample holder and placed in storage boxes.
These pin stubs are fully compatible with the FEI Teneo VS SEM system; Ø3.1mm pin, Ø8mm head and raised platform for sample mounting. Manufactured from vacuum grade aluminium.

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