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Etiquette
An intensive study from 1992 throughout 2000 has shown that Hemo-De® (d-Limonene) a terpene-based chemical…
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An intensive study from 1992 throughout 2000 has shown that Hemo-De® (d-Limonene) a terpene-based chemical with a pleasant citrus fragrance, was able to replace many of the clinical laboratories toxic reagents, such as carbol-xylene, xylene, ethyl acetate and formalin. In Parasitology – Hemo-De replaces ethyl acetate in the concentration procedure; Hemo-De replaces carbol-xylene, xylene and […]
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Etiquette
MSDS Storage : RT Unit : 500 ml
Etiquette
Unit : 450 ml  
Etiquette
Unit : each, 1 gal Storage : RT MSDS
Etiquette
This unique primer affords you a better adhesion between your resin and specimen that you…
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This unique primer affords you a better adhesion between your resin and specimen that you are embedding and prevents the sample from pulling away from the resin during sectioning. Unit : 100 ml Storage : RT
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use…
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8'') diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling.
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use…
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8'') diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use…
Show more (+)
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8'') diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling.
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use…
Show more (+)
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8”) diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin […]
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The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use…
Show more (+)
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all Zeiss SEM pin stubs is 3.2mm (1/8'') diameter. They are made from high quality, vacuum grade aluminium. The Zeiss SEM pin stubs are manufactured according to original specifications for the pin stubs and additional style are added to enable a wide range of applications. The most popular Zeiss pin stubs are the pin stubs with the 12.7 and 25.4mm top diameter. Most of the flat Zeiss SEM pin stubs have a 3.2mm platform height and a groove to enable easy holding and handling.
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