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Model 700-2D, AFM
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model 301BE, SEM Pin
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model 301BE, SEM Pin
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model 301BE, SEM Pin
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model PT
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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SPM, AFM, SEM Calibration Standards
Magnification Reference Standards - SPM, AFM, SEM Calibration StandardsA series of calibration standards with one…
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Magnification Reference Standards - SPM, AFM, SEM Calibration StandardsA series of calibration standards with one and two dimension calibrated patterns. The standards come in two grid spacings – 300 nanometers and 700 nanometers. These standardsare created utilizing holographic interference of a particular laser frequency. They are typically accurate to <1% across the entire surface of the standard.
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