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Model 301BE, SEM Pin
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model 301BE, SEM Pin
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
Show more (+)
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model 301BE, SEM Pin
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
Show more (+)
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model PT
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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