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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For…
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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […]
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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For…
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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […]
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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For…
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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […]
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM…
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Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […]
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