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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-) |
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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-) |
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Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-) |
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The Chessy test specimen comprises more than 1.6 million gold squares on silicon which… Show more (+) The Chessy test specimen comprises more than 1.6 million gold squares on silicon which form a four-fold chequerboard pattern in an area of 5mm square. Overall Size of specimen is 10 mm x 10 mmeach Show less (-) |
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A holey carbon film is shadowed with gold and graphitized carbon particles are deposited on… Show more (+) A holey carbon film is shadowed with gold and graphitized carbon particles are deposited on a 3.05mm grid. These particles viewed over the holes may be used for assessment of factors limiting the microscope performance. The evaporated gold forms small polycrystalline islands and within these islands lattice fringes can be resolved. Also use this specimen for the measurement of contamination rates in the EM by noting the deposition rate of carbon within the holes found in the gold film. Show less (-) |
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Plane Spacing 0.9nm and 0.45nm – Asbestos Crocidolite. |
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L'échantillon de test KPFM & EFM a été spécialement conçu pour tester les performances de… Show more (+) L'échantillon de test KPFM & EFM a été spécialement conçu pour tester les performances de la microscopie à force à sonde Kelvin et de la microscopie à force électrostatique. Cet échantillon de test pratique est constitué de réseaux avec des lignes alternées d'aluminium et d'or déposées sur un substrat de silicium recouvert d'oxyde de silicium Show less (-) |
