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Delta Microscopies

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Model 150-2D, AFM
Model 150-2D, choose mount
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM…
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Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […]
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Model 150-2D, AFM
Model 150-2D, SEM Pin
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM…
Show more (+)
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […]
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Model 150-2D, AFM
Model 150-2D, unmounted
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM…
Show more (+)
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […]
Show less (-)
Model 150-2D, AFM
Model 150-2DUTC, AFM
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM…
Show more (+)
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […]
Show less (-)
Model 150-2D, AFM
Model 150-2DUTC, choose mount
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM…
Show more (+)
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […]
Show less (-)
Model 150-2D, AFM
Model 150-2DUTC, SEM Pin
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM…
Show more (+)
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […]
Show less (-)
Model 150-2D, AFM
Model 150-2DUTC, unmounted
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM…
Show more (+)
Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […]
Show less (-)
Model 300-1D, AFM
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
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SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model 300-1D, choose mount
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
Show more (+)
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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Model 300-1D, SEM Pin
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of…
Show more (+)
SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […]
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